Zeiss Supra 40VP SEM

The Zeiss Supra 40VP scanning electron microscope provides high resolution surface imaging with three-dimensional appearance. It is equipped with a field emission cathode as electron source and three different detectors (SE2, InLens, STEM). It can be used for fixed, critical point dried samples as well as for fresh material in variable pressure mode or for fresh, cryofixed tissue in cryo-mode.

  • Maximum resolution: 1 nm
  • Magnification range: 12x - 900,000x
  • Acceleration voltage: max. 30 kV
  • Software: SmartSEM
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